PJRC forum member dukeblue219 has shared a retrospective of NASA’s use of Teensy boards over the past six years.

Starting with the Teensy 3.1 testing planar NAND flash at the Lawrence Berkeley National Lab, its many uses have most recently included facilitating research with an 8 Tb, 96-layer 3D NAND flash via a Teensy 4.1.

Generally, devices are used for fun NASA-type evaluations such as testing for “single-event upsets” (a flipped bit), “single-event functional interrupts” (a crash) or “single-event latch-up” when radiation completely short-circuits a component. More examples and pictures can be seen in the original thread.